Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences SEM Carbon Planchet, 25.4 mm, 1.6 mm height
Carbon planchet for scanning electron microscopy (SEM).
Surface: 1"
Height: 1.6 mm
Electron Microscopy Sciences Cambridge S4 Mark II, S-410 Pin Stub 1-1/2" head, 3/16" height, Aluminum
Scanning electron microscope specimen mounts for Cambridge S4, Mark II, and S-410. Made from ultra-pure aluminum.
Head: 1-1/4"
Height: 3/16"
Electron Microscopy Sciences New Porton Graticle NG12, 19mm
The NG12 is particularly useful since the array of globes and circles are conveniently close to where the particles pass. At the end of each band of the sample the mechanical stage is traversed vertically to take in the next band until the whole sample has been covered.
Size: 19 mm
Dino Lite N3C-R Light Focuser Front Cap
Working seamlessly with the Dino-Lite Edge series, the N3C-R front cap is a unique and the simplest solution designed to provide ring illumination for a microscope. The 6.5 cm (2.5 inch) diameter N3C-R fully utilizes the Dino-Lite's built-in LEDs by redirecting it to form a focused, diffused, and uniform ring-light.Without the clutter of mounting and powering an external ring light, thus no heat and noticeable weight been added, the clip-on N3C-R economically provides alternative illumination and adds more flexibility to Dino-Lite’s applications. Note: The N3C-R has best working distance in the range of about 2 to 15 cm. It may not be suitable for short working distance operation, and is not compatible with high magnification models such as AM4515T8.
Electron Microscopy Sciences SEM Very High Resolution Gold on Carbon Test Specimen, JEOL Stub
For very high resolution performance testing this specimen has a smaller gold particle size ranging from 2 nm to 30 nm as compared to the high resolution test above. Ideal for testing at instrument magnifications of 50,000x and above.
Mount: JEOL Stub
Electron Microscopy Sciences X-Checker™ Calibration Aid for SEM/EDS Standard
The X-Checker was the first and remains the only complete calibration aid for SEM/EDS Systems. Each X-Checker comes with manganese to measure full width at half max detector resolution, aluminum and copper to perform spectral calibration, and carbon to monitor calibration at the low end of the spectra for thin window detectors. You also get two grid sizes for checking the accuracy of your image analysis software and an easy test for monitoring the amount of vacuum pump oil contamination on your detector window. Comes with: manganese, aluminum and copper, carbon.
Electron Microscopy Sciences Walton & Beckett Graticule G24, 16 mm, 5:1 ratio
The Walton and Beckett graticule is for counting fibrous dust (asbestos or glass fibers) and particularly where the majority of fibers to be counted are shorter than 5 microns. The circle is divided into four by two diametrical lines scaled in units of 5 and 3 microns respectively. 3 and 5 microns are the critical measurements of fiber lengths and diameters used in fiber counting. Walton and Beckett include shapes with an aspect ratio of 3:1 or 5:1 for comparing to fibers.
IMPORTANT NOTE: The circle on these Walton & Beckett graticules must represent 100 microns at the stage and each one must be manufactured to the individual instrument. 5:1 ratio is useful where the majority of fibers to be counted are shorter than 5 um.
Size: 16 mm
Electron Microscopy Sciences SEM Ultra High Resolution Gold on Carbon Test Specimen, JEOL Stub
With gold particles ranging from <1 nm to 20 nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.
Mount: JEOL Stub
Uline Convertible Aluminum Hand Truck
A lightweight aluminum multi-purpose hand truck with a nose plate that converts from a 2-wheel vertical dolly to a 4-wheel horizontal cart for transporting and moving boxes, equipment, and cargo.
Electron Microscopy Sciences EMS Tungsten Loop Filament New, Philips, FEI
Our Electron microscope Tungsten filaments have a rigid attachment of the filament wire to the post with no possiblity of waving and a minimum tip radius for a coherent beam. The base assembly of all of our new filaments are guaranteed to be rebuildable for the lifetime of the electron beam instrument. Inspected for consistent quality and performance before being shipped to you. Return the base and we will rebuild the filament.
Use: Philips, FEI
Electron Microscopy Sciences Gilder Standard Square 300 mesh Cu/Pd Grid
A reliable support specimen grid source. Features well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. 3.05 mm diameter, 0.7 mil (18 um) thickness.
Grid: Copper/Palladium
Pitch: 83 µm
Hole: 58 µm
Bar: 25 µm
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Electron Microscopy Sciences Gilder Hexagonal 400 mesh Gold Grid
A reliable support specimen grid source. Features: well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. The copper grids with palladium plating offers better grid strength and avoids tarnishing. 3.05 mm diameter, 0.7 mil (18um) thickness.
Grid: Gold
Pitch: 62 µm
Hole: 37 µm
Bar: 25 µm